A New Tool for Six Sigma in Manufacturing
Robert
L. Horst, P.E.—Consultant and Founder
Peak Productivity USA, P.O. Box 681, Lancaster PA 17608
horst@peaksigma.com
A proprietary1
Six-Sigma Isogrammetric Analysis Method (SSIAM) is
a new tool for achieving lean and efficient manufacturing. Graphing
data on isograms can visually present factory-floor personnel
with the sigma-level metric and level-of-defectives actually achieved,
says Robert L. Horst of the technical consultancy Peak Productivity
USA, in a recent issue of SME Manufacturing Engineering
magazine.
The Motorola six-sigma model defines a criterion for excellence,
promising extremely high yields, with a maximum of 3.4 defectives-per-million
(dpM). Defectives are defined as errors, faulty parts or actions,
and out-of-tolerance variables.
A unique feature of
the six-sigma peak-yield ideal is that it acknowledges an acceptable
degree of drift (process shift) of variables from target, and
permits a defined zone of variation. No process adjustments need
to be made when the collected data stay within the limits of ±1˝
sigma, as long as manufacturing specifications are consistent
with a process tolerance of ±6σ corresponding to a process
capability index (Cp) of 2. An alternative ±4˝σ tolerance
yields a maximum of 1.3 defectives-per-thousand (dpK) and corresponds
to Cp = 1.5.
Another feature of the six-sigma model is the relevance of short-term
versus long-term data collection. To meet the 6σ criterion,
short-term data need to exhibit a standard deviation that
fits with the process tolerance. Long-term data may (and
likely will) exhibit process drift across the allowable ±1˝σ
zone, yielding a centered distribution with larger standard deviation.
To achieve a high production yield, the focus is always on reducing
the data scatter represented by the spread of the Gaussian bell
curve.
The power of sigma-level performance analysis for the improvement
of manufacturing processes kicks in where the usefulness of statistical
process control (SPC) diminishes. SPC is a powerful analytical
tool for out-of-control process/product variables, but it's inadequate
for quantitative analysis of "in-control," high-yield processes.
SPC practice always focuses on centering the mean value, on reducing
process shift to a minimum. Standard deviation is used to establish
upper and lower control limits of ±3σ, representing 99.7%
yield for a perfectly in-control, centered-on-target process.
The value of sigma-level analysis is in the quantification of
variable data with respect to required process tolerances rather
than intrinsic control limits assigned by SPC rules. It's an approach
that leads to the discovery of rogue variables that prevent the
achievement of high yields.
In the broad perspective, knowledge of sigma-level performance
for key variables--in every production process--alerts operators
and signals management, leading to fact-based decision-making
and corrective actions that are essential for achieving higher
productivity.
Peak Productivity USA's proprietary approach is called the Six
Sigma Isogrammetric Analysis Method (SS IAM). It uses isograms
of constant process yield to determine the probable sigma-level
metric (yield) associated with measurable process variables in
a production process.
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1-Protected
by U.S. Patent 5,715,181 and Copyright 1998-2004
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In the SSIAM
method, statistical performance data are plotted on an
isogrammetric chart or keyboarded into a computer running
the isogrammetric program. This reveals probable process
yield and level-of-defectives produced.
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Mean-value shift (in σ units) and ratio (tolerance-to-σ)
are plotted, respectively, as X, Y coordinates on isogrammetric
graphs. Data points show the sigma metric and the achieved level-of-defectives,
without the encumbrance of reference tables and associated calculations
that, likely, are not practical for use by production personnel.
The SSIAM tool is particularly effective
for high-yield processes where statistical sampling and inspection
methods tend to miss the relatively few defectives, and where
process variables are supposedly "in control" by SPC rules.
Isogrammetric analysis merges SPC and sigma-level measurement
criteria. When implemented on-line in factories, it provides real-time
feedback in terms of probable level-of-defectives from variables
data, informing plant-floor employees of the need to take action
to stabilize production processes. Incremental increases in process
yield will produce calculable savings in materials, energy, and
labor, and can mean the difference between profit and loss on
the balance sheet.
Read the complete
article published
in SME Manufacturing Engineering magazine—"Measuring and
Achieving Six Sigma Performance," July 2004.
The author, Robert L. Horst, PE, is a Life Fellow of IEEE, a Senior
Member of SME, and the founder of Peak Productivity USA.